Refractory brick size measurement and defect detection method

Refractory brick size measurement and defect detection method

The invention discloses a refractory brick size measurement and defect detection method. The method comprises the following steps: S1, collecting point cloud data of a to-be-detected refractory brick by using a 3D camera; s2, obtaining the point cloud of the upper surface of the to-be-detected refra...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WU ZIHAO, ZHANG FAQUAN, CHEN TINGWEI, ZHOU LIBING, SUN CHENGLU, KONG DEJIN, ZHOU YANG, WANG CUNCHAO, SHEN MANDE
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The invention discloses a refractory brick size measurement and defect detection method. The method comprises the following steps: S1, collecting point cloud data of a to-be-detected refractory brick by using a 3D camera; s2, obtaining the point cloud of the upper surface of the to-be-detected refractory brick, and carrying out point cloud filtering and point cloud screening processing; s3, carrying out surrounding frame processing in the minimum external connection direction, and judging whether the length and width sizes of the to-be-detected refractory brick are qualified or not; s4, fitting plane point cloud processing is carried out, and the orthogonal distance between the fitting plane of the upper surface and the origin of the coordinate system is calculated; s5, obtaining a reference surface point cloud, and carrying out point cloud filtering processing on the reference surface point cloud; s6, calculating the orthogonal distance between the fitting plane of the reference plane and the origin of the c