Quantitative evaluation method for afterimage of silicon-based OLED micro display screen

The invention relates to the technical field of OLED display screen testing, in particular to a silicon-based OLED micro display screen ghosting quantitative evaluation method, which comprises the following steps: taking a high-contrast checkerboard as a test picture, switching to a monochromatic picture after the checkerboard is continuously displayed on a display screen for a specified time, acquiring the test image by using an industrial-grade COMS digital area-array camera, and carrying out quantitative evaluation on the ghosting of the silicon-based OLED micro display screen. Carrying out processing and feature value extraction on the acquired test image through a computer, and processing the test image to enhance image features; and finally obtaining the gray level change value of the current test image and comparing the gray level change value with the ghost judgment threshold. According to the method, the image is acquired through the industrial-grade camera, and noise is reduced through image process