Stamping part surface defect detection method based on small sample

The invention relates to the technical field of stamping part surface defect detection, solves the problems that in the prior art, the omission ratio of image fine defect detection is high and fine defects cannot be accurately detected, and particularly relates to a stamping part surface defect dete...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WU SIBO, WANG JUN, JIA WENRU, LI ZIKUAN, LI DAWEI
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention relates to the technical field of stamping part surface defect detection, solves the problems that in the prior art, the omission ratio of image fine defect detection is high and fine defects cannot be accurately detected, and particularly relates to a stamping part surface defect detection method based on a small sample, which comprises the following steps: S1, acquiring to-be-detected image data I by adopting a CCD camera; s2, preprocessing the image data I to be detected by adopting a contrast enhancement network based on image inverse mapping to obtain an enhanced full-resolution image P; and S3, inputting the full-resolution image P into the improved SSD-Net detection network, and training the improved SSD-Net detection network in combination with the loss function L. According to the invention, fine defects on the surface of the stamping part can be accurately detected, the omission ratio of defect detection is further reduced, the dependence of traditional defect detection on samples is r