Ex-factory quality inspection method and system for directly-inserted LED lamp beads
The invention discloses a factory quality inspection method and system for directly-inserted LED lamp beads. The factory quality inspection method comprises the steps that a first detection side redistribution list is obtained according to first historical detection statistical information and secon...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a factory quality inspection method and system for directly-inserted LED lamp beads. The factory quality inspection method comprises the steps that a first detection side redistribution list is obtained according to first historical detection statistical information and second historical detection statistical information; obtaining a first emphasis compensation parameter set according to the quality inspection product influence information, and correcting the first detection emphasis redistribution list based on the first emphasis compensation parameter set to obtain a second detection emphasis redistribution list; carrying out data acquisition based on an image acquisition device and a temperature acquisition device through a second detection side redistribution list, and carrying out factory spot check test on the direct insertion LED lamp beads based on the first image set and the first temperature acquisition set to obtain a first spot check result; and carrying out factory pre-war |
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