Memory reliability evaluation method and device and storage medium

The invention discloses a memory reliability assessment method and device and a storage medium, relates to the field of storage, and helps to accurately assess memory reliability based on comprehensive memory fault information. The method comprises the steps of obtaining a target running log package...

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Bibliographische Detailangaben
Hauptverfasser: BAO QUANYANG, WEI WEIWEI, ZHANG GUANGBIAO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a memory reliability assessment method and device and a storage medium, relates to the field of storage, and helps to accurately assess memory reliability based on comprehensive memory fault information. The method comprises the steps of obtaining a target running log package of computing equipment; analyzing the target running log packet to obtain parameter group data; wherein the parameter group data comprises memory fault parameters of the computing equipment; inputting the parameter group data into the memory fault prediction model to obtain a memory fault prediction result of the computing device; wherein the memory fault prediction result is used for representing the severity of the memory fault of the computing device. 本申请公开了一种内存可靠性评估方法、装置及存储介质,涉及存储领域,有助于基于全面的内存故障信息准确的评估内存可靠性。方法包括:获取计算设备的目标运行日志包;对目标运行日志包进行解析,得到参数组数据;其中,参数组数据包括计算设备的内存故障参数;将参数组数据输入内存故障预测模型,得到计算设备的内存故障预测结果;其中,内存故障预测结果用于表征计算设备的内存故障的严重程度。