Operation chip module test method, test circuit, test equipment and storage medium

The invention discloses an operation chip module test method, a test circuit, test equipment and a storage medium, relates to the technical field of electronics, and solves the problem of complex structure required by a chip module test method. The operation chip module test method is applied to a microcontroller, and the method comprises the following steps: obtaining operation task information sent by a main controller, and sending the operation task information to an operation chip module, so that the operation chip module executes an operation task according to the operation task information; chip module parameters of an operation chip module are obtained, and the operation chip module comprises at least one application-specific integrated circuit chip; determining a control parameter corresponding to the target module according to the chip module parameter; and sending a control instruction to the target module according to the control parameter so as to control the target module. According to the method