Wafer edge temperature correction in batch thermal processing chamber
A process kit for use in a process chamber, the process kit comprising: an outer liner; an inner liner configured to be in fluid communication with a gas injection assembly and a gas discharge assembly of the processing chamber; the first annular reflector is arranged between the outer lining and th...
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creator | PANDEY VISHWAS KUMAR CHU SCHUBERT S MORADIA ALLA ZHU ZUOMING RANGAPPA, SRINIVASA MYO NYI O LAU SHU-KWAN XIAN, KARTIK, BHUPENDRA TANO ADEL GEORGES KUMAR SURAJIT BURROWS, BRIAN HAYES |
description | A process kit for use in a process chamber, the process kit comprising: an outer liner; an inner liner configured to be in fluid communication with a gas injection assembly and a gas discharge assembly of the processing chamber; the first annular reflector is arranged between the outer lining and the inner lining; a top plate and a bottom plate attached to an inner surface of the neck bush, the top plate and the bottom plate together with the neck bush forming a housing; a cassette disposed within the housing, the cassette including a plurality of shelves configured to hold a plurality of substrates thereon; and an edge temperature correction element disposed between the neck bush and the first annular reflector.
一种用于处理腔室中的处理套组,该处理套组包括:外衬套;内衬套,被配置为与处理腔室的气体注入组件及气体排放组件流体连通;第一环形反射器,设置在该外衬套与该内衬套之间;顶板及底板,附接于该内衬套的内表面,该顶板及底板与内衬套一起形成外壳;盒匣,设置在外壳之内,该盒匣包含被配置为在其上保持多个基板的多个搁架;及边缘温度校正元件,设置在该内衬套与第一环形反射器之间。 |
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一种用于处理腔室中的处理套组,该处理套组包括:外衬套;内衬套,被配置为与处理腔室的气体注入组件及气体排放组件流体连通;第一环形反射器,设置在该外衬套与该内衬套之间;顶板及底板,附接于该内衬套的内表面,该顶板及底板与内衬套一起形成外壳;盒匣,设置在外壳之内,该盒匣包含被配置为在其上保持多个基板的多个搁架;及边缘温度校正元件,设置在该内衬套与第一环形反射器之间。</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC HEATING ; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221216&DB=EPODOC&CC=CN&NR=115485822A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221216&DB=EPODOC&CC=CN&NR=115485822A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PANDEY VISHWAS KUMAR</creatorcontrib><creatorcontrib>CHU SCHUBERT S</creatorcontrib><creatorcontrib>MORADIA ALLA</creatorcontrib><creatorcontrib>ZHU ZUOMING</creatorcontrib><creatorcontrib>RANGAPPA, SRINIVASA</creatorcontrib><creatorcontrib>MYO NYI O</creatorcontrib><creatorcontrib>LAU SHU-KWAN</creatorcontrib><creatorcontrib>XIAN, KARTIK, BHUPENDRA</creatorcontrib><creatorcontrib>TANO ADEL GEORGES</creatorcontrib><creatorcontrib>KUMAR SURAJIT</creatorcontrib><creatorcontrib>BURROWS, BRIAN HAYES</creatorcontrib><title>Wafer edge temperature correction in batch thermal processing chamber</title><description>A process kit for use in a process chamber, the process kit comprising: an outer liner; an inner liner configured to be in fluid communication with a gas injection assembly and a gas discharge assembly of the processing chamber; the first annular reflector is arranged between the outer lining and the inner lining; a top plate and a bottom plate attached to an inner surface of the neck bush, the top plate and the bottom plate together with the neck bush forming a housing; a cassette disposed within the housing, the cassette including a plurality of shelves configured to hold a plurality of substrates thereon; and an edge temperature correction element disposed between the neck bush and the first annular reflector.
一种用于处理腔室中的处理套组,该处理套组包括:外衬套;内衬套,被配置为与处理腔室的气体注入组件及气体排放组件流体连通;第一环形反射器,设置在该外衬套与该内衬套之间;顶板及底板,附接于该内衬套的内表面,该顶板及底板与内衬套一起形成外壳;盒匣,设置在外壳之内,该盒匣包含被配置为在其上保持多个基板的多个搁架;及边缘温度校正元件,设置在该内衬套与第一环形反射器之间。</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC HEATING</subject><subject>ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyj0OgkAQBlAaC6PeYTyABSgJrSEYKysTSzKMH-wm7E9mx_vbeACr17xtNbx4hhLeC8gQMpTtoyBJqhDzKZKPNLGJI3PQwCtlTYJSfFxIHIcJuq82M68Fh5-76ngbnv39hJxGlMyCCBv7R123l67tmuZ6_ud8AQ4CM3k</recordid><startdate>20221216</startdate><enddate>20221216</enddate><creator>PANDEY VISHWAS KUMAR</creator><creator>CHU SCHUBERT S</creator><creator>MORADIA ALLA</creator><creator>ZHU ZUOMING</creator><creator>RANGAPPA, SRINIVASA</creator><creator>MYO NYI O</creator><creator>LAU SHU-KWAN</creator><creator>XIAN, KARTIK, BHUPENDRA</creator><creator>TANO ADEL GEORGES</creator><creator>KUMAR SURAJIT</creator><creator>BURROWS, BRIAN HAYES</creator><scope>EVB</scope></search><sort><creationdate>20221216</creationdate><title>Wafer edge temperature correction in batch thermal processing chamber</title><author>PANDEY VISHWAS KUMAR ; CHU SCHUBERT S ; MORADIA ALLA ; ZHU ZUOMING ; RANGAPPA, SRINIVASA ; MYO NYI O ; LAU SHU-KWAN ; XIAN, KARTIK, BHUPENDRA ; TANO ADEL GEORGES ; KUMAR SURAJIT ; BURROWS, BRIAN HAYES</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115485822A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC HEATING</topic><topic>ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>PANDEY VISHWAS KUMAR</creatorcontrib><creatorcontrib>CHU SCHUBERT S</creatorcontrib><creatorcontrib>MORADIA ALLA</creatorcontrib><creatorcontrib>ZHU ZUOMING</creatorcontrib><creatorcontrib>RANGAPPA, SRINIVASA</creatorcontrib><creatorcontrib>MYO NYI O</creatorcontrib><creatorcontrib>LAU SHU-KWAN</creatorcontrib><creatorcontrib>XIAN, KARTIK, BHUPENDRA</creatorcontrib><creatorcontrib>TANO ADEL GEORGES</creatorcontrib><creatorcontrib>KUMAR SURAJIT</creatorcontrib><creatorcontrib>BURROWS, BRIAN HAYES</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PANDEY VISHWAS KUMAR</au><au>CHU SCHUBERT S</au><au>MORADIA ALLA</au><au>ZHU ZUOMING</au><au>RANGAPPA, SRINIVASA</au><au>MYO NYI O</au><au>LAU SHU-KWAN</au><au>XIAN, KARTIK, BHUPENDRA</au><au>TANO ADEL GEORGES</au><au>KUMAR SURAJIT</au><au>BURROWS, BRIAN HAYES</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Wafer edge temperature correction in batch thermal processing chamber</title><date>2022-12-16</date><risdate>2022</risdate><abstract>A process kit for use in a process chamber, the process kit comprising: an outer liner; an inner liner configured to be in fluid communication with a gas injection assembly and a gas discharge assembly of the processing chamber; the first annular reflector is arranged between the outer lining and the inner lining; a top plate and a bottom plate attached to an inner surface of the neck bush, the top plate and the bottom plate together with the neck bush forming a housing; a cassette disposed within the housing, the cassette including a plurality of shelves configured to hold a plurality of substrates thereon; and an edge temperature correction element disposed between the neck bush and the first annular reflector.
一种用于处理腔室中的处理套组,该处理套组包括:外衬套;内衬套,被配置为与处理腔室的气体注入组件及气体排放组件流体连通;第一环形反射器,设置在该外衬套与该内衬套之间;顶板及底板,附接于该内衬套的内表面,该顶板及底板与内衬套一起形成外壳;盒匣,设置在外壳之内,该盒匣包含被配置为在其上保持多个基板的多个搁架;及边缘温度校正元件,设置在该内衬套与第一环形反射器之间。</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Wafer edge temperature correction in batch thermal processing chamber |
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