Serial advanced technology attachment (SATA) interface memory parallel test system

The invention provides an SATA (Serial Advanced Technology Attachment) interface memory parallel test system. The system comprises a test server in which test software is pre-installed and a plurality of PCIE to SATA expansion cards are configured; the test carrier plates are divided into interface areas and a plurality of parallel test areas, MiniSAS interfaces are arranged in the interface areas, memory test clamps are arranged in the test areas, and the MiniSAS interfaces are simultaneously connected with the corresponding number of SATA interfaces on the corresponding PCIE to SATA expansion cards through MiniSAS to multiple SATA data lines; and the high and low temperature test box is used for providing a temperature environment required by the memory test. According to the invention, the problems of low efficiency and high cost of the existing SATA interface memory test can be effectively solved. 本发明提供一种SATA接口存储器并行测试系统。该系统包括：测试服务器，测试服务器内预装有测试软件，并且配置有多个PCIE转SATA扩展卡；多个测试载板，测试载板划分为接口区和多个并行的测试区，接口区内设置有MiniSA