Remaining life evaluation method of component, functional module and system

The invention provides a residual life evaluation method, device and system of an electronic system, the electronic system at least comprises an electronic component, and the residual life evaluation method of the electronic system comprises the following steps: S1, collecting stress information of the electronic system according to each time interval, summarizing the stress information data in a time period to obtain stress factors; s2, obtaining the failure rate of each component of the system based on the stress factor and a failure rate algorithm, thereby calculating the failure rate of the system; s3, obtaining the reliability life of the system based on the failure rate of the system and the average fault-free time of the system so as to obtain the accumulated damage rate of the system in the time period; and S4, calculating the residual life of the system based on the rated life or the fatigue life of the system. The method is good in expandability and low in manufacturing cost, the residual life of th