Method and device for detecting defects on surface of mirror-like workpiece

The invention discloses a mirror-like workpiece surface defect detection method and a mirror-like workpiece surface defect detection device. The method comprises the following step: carrying out auxiliary irradiation on the same position by adopting white light, cosine stripe light and binary stripe...

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Bibliographische Detailangaben
Hauptverfasser: LIU PENG, LIANG YANLONG, DU YIFU, ZHANG ZHEN, BAO NIANYUAN, GAO XIUBIN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a mirror-like workpiece surface defect detection method and a mirror-like workpiece surface defect detection device. The method comprises the following step: carrying out auxiliary irradiation on the same position by adopting white light, cosine stripe light and binary stripe light according to a preset emergent angle and light intensity. Acquiring a first image corresponding to the white light, a second image corresponding to the cosine stripe light and a third image corresponding to the binary stripe light at the same position according to a preset shooting angle; acquiring first defect information in the first image, second defect information in the second image and third defect information in the third image based on image processing, wherein each piece of defect information comprises coordinates, sizes and shapes; intercepting a first defect graph from the first image; marking a second defect in the third image, and intercepting a second defect graph and a third defect graph from