Method and system for detecting burial depth of internal defect of non-thermal insulation material

The invention provides a method and a system for detecting the burial depth of an internal defect of a non-heat-insulating material. The method comprises the following steps: acquiring and storing an infrared thermal image of the surface of the non-heat-insulating material; analyzing the surface tem...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHENG HAN, MA YANGFAN, LAN HENGXING, LIU CHANGQING, BAO HAN, GUO GUANMIAO, LYU HONGTAO, YAN CHANGGEN, CHEN ZHIYANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention provides a method and a system for detecting the burial depth of an internal defect of a non-heat-insulating material. The method comprises the following steps: acquiring and storing an infrared thermal image of the surface of the non-heat-insulating material; analyzing the surface temperature field of the non-heat-insulating material, and identifying the corresponding position of the internal defect on the surface of the material; extracting a defect area surface temperature value T1 and a defect-free area surface temperature value T2, and obtaining temperature differences delta T = T1-T2 at different moments t; solving the calculated value of the defect burial depth corresponding to different temperature differences at each moment; the optimal time is analyzed, and the finally determined defect burial depth is obtained. According to the method for detecting the burial depth of the internal defect of the non-heat-insulating material, nondestructive, rapid, non-contact, non-magnetic and convenie