Method and system for detecting burial depth of internal defect of non-thermal insulation material
The invention provides a method and a system for detecting the burial depth of an internal defect of a non-heat-insulating material. The method comprises the following steps: acquiring and storing an infrared thermal image of the surface of the non-heat-insulating material; analyzing the surface tem...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a method and a system for detecting the burial depth of an internal defect of a non-heat-insulating material. The method comprises the following steps: acquiring and storing an infrared thermal image of the surface of the non-heat-insulating material; analyzing the surface temperature field of the non-heat-insulating material, and identifying the corresponding position of the internal defect on the surface of the material; extracting a defect area surface temperature value T1 and a defect-free area surface temperature value T2, and obtaining temperature differences delta T = T1-T2 at different moments t; solving the calculated value of the defect burial depth corresponding to different temperature differences at each moment; the optimal time is analyzed, and the finally determined defect burial depth is obtained. According to the method for detecting the burial depth of the internal defect of the non-heat-insulating material, nondestructive, rapid, non-contact, non-magnetic and convenie |
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