Small-disturbance primary frequency modulation qualified rate testing method, medium and system

The invention discloses a small-disturbance primary frequency modulation qualified rate test method, a medium and a system. The method comprises the following steps: 1) extracting primary frequency modulation small-disturbance frequency data of a unit; 2) randomly selecting a group of small disturba...

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Hauptverfasser: CHEN HOUTAO, SHENG KAI, XUN XIN, ZHU XIAOXING, WANG XIHUI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a small-disturbance primary frequency modulation qualified rate test method, a medium and a system. The method comprises the following steps: 1) extracting primary frequency modulation small-disturbance frequency data of a unit; 2) randomly selecting a group of small disturbance frequency data from the primary frequency modulation small disturbance frequency data of the unit, and generating a primary frequency modulation small disturbance test signal; 3) according to the primary frequency modulation small-disturbance test signal, obtaining small-disturbance test primary frequency modulation power response data and calculating a contribution electric quantity rate; and 4) repeating the steps 2)-3) after a certain time interval, collecting to obtain a contribution power rate data set, and obtaining a small-disturbance primary frequency modulation qualified rate according to the contribution power rate data set. The overall operation is simple and convenient, the problem that the primary