Method for rapidly and accurately solving true thickness of rock stratum based on solid geometry model

The invention discloses a method for rapidly and accurately solving the true thickness of a rock stratum based on a solid geometry model. The method comprises the following steps: step 1, acquiring basic data; acquiring coordinates and elevations of any point on the top and bottom surfaces of the ro...

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Bibliographische Detailangaben
Hauptverfasser: ZHAN YANPING, SHI JUNHU, YAN YINGZHENG, ZHANG LINBO, WANG QIGUO, YUAN YANGYANG, LIN SHIXIANG, ZHAN WEI, HUANG ZHENWEI, WANG QILONG, PENG LIANGYU, LIU HENG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a method for rapidly and accurately solving the true thickness of a rock stratum based on a solid geometry model. The method comprises the following steps: step 1, acquiring basic data; acquiring coordinates and elevations of any point on the top and bottom surfaces of the rock stratum; measuring the occurrence of the rock stratum surface; 2, establishing a solid geometric model; setting the top surface and the bottom surface of the rock stratum to be planes and parallel; making a top surface and a bottom surface of a rock stratum in a cuboid, and marking a top surface point and a bottom surface point of the rock stratum; drawing line segments representing the true thickness of the rock stratum through a series of auxiliary lines and points, and establishing a solid geometric model; 3, based on the solid geometry model, deducing a solution formula of the true thickness of the rock stratum under various conditions; 4, establishing a rock stratum true thickness general formula; and 5, su