Management system and method for standard sample piece in chip test

The invention discloses a management system and method for a standard sample piece in chip testing. The system comprises a data acquisition module used for acquiring on-chip testing data of a chip; the ledger management module is used for carrying out classified management on the chips and recording...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WU XIAODONG, HU LIULIN, LYU JIPING, WU HAIFENG, LI HONGDI, WANG CETIAN, SHI JUN, TONG WEI, LU CHAOBAO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING HANDLING RECORD CARRIERS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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