Management system and method for standard sample piece in chip test

The invention discloses a management system and method for a standard sample piece in chip testing. The system comprises a data acquisition module used for acquiring on-chip testing data of a chip; the ledger management module is used for carrying out classified management on the chips and recording test count values of the standard sample pieces; and the database is used for storing and analyzing different types of standard samples. According to the method disclosed by the invention, the consistency of the test platform can be calibrated through a standard sample piece test, and a statistical result which is close to the reality of a database can be achieved by optimizing and compensating test data. 本发明公开了一种芯片测试中标准样品件的管理系统及方法，系统包括数据采集模块：用于采集芯片的在片测试数据；台账管理模块：用于对芯片进行分类管理，并记录标准样品件的测试计数值；数据库：用于存储及分析不同类型的标准样品件。本发明方法不仅可以通过标准样品件测试对测试平台的一致性进行标定，也可以通过对测试数据进行优化补偿达到数据库接近真实的统计结果。