Residual life prediction method for intelligent electric meters under different subsystems
The invention provides a residual life prediction method for intelligent ammeters under different subsystems, and belongs to the technical field of intelligent ammeters. The problem that the existing intelligent electric meter residual life prediction is difficult to popularize or the degradation mo...
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| creator | CUI GUOLEI YANG HUIJUN XUE YIFEI ZHAO HAIYUAN ZHANG YANJUN JIA ZHENHUA LI JING LYU NING WANG CHUNYAN YIN JUNSHAN NING YONGMING |
| description | The invention provides a residual life prediction method for intelligent ammeters under different subsystems, and belongs to the technical field of intelligent ammeters. The problem that the existing intelligent electric meter residual life prediction is difficult to popularize or the degradation model is uncertain is solved; comprising the following steps that electromechanical equipment in a building is divided into six subsystems, part of data of known subsystem categories serve as training data to construct a classification model, and the classification model is utilized to obtain operation data of an intelligent electric meter under each subsystem; preprocessing the operation data of the intelligent electric meter, obtaining the main stress influencing the prediction of the residual life of the intelligent electric meter through a correlation analysis method, and selecting the operation data under the main stress to form a data set; performing normalization processing on the data set; dividing a normaliz |
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The problem that the existing intelligent electric meter residual life prediction is difficult to popularize or the degradation model is uncertain is solved; comprising the following steps that electromechanical equipment in a building is divided into six subsystems, part of data of known subsystem categories serve as training data to construct a classification model, and the classification model is utilized to obtain operation data of an intelligent electric meter under each subsystem; preprocessing the operation data of the intelligent electric meter, obtaining the main stress influencing the prediction of the residual life of the intelligent electric meter through a correlation analysis method, and selecting the operation data under the main stress to form a data set; performing normalization processing on the data set; dividing a normaliz</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221118&DB=EPODOC&CC=CN&NR=115358347A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221118&DB=EPODOC&CC=CN&NR=115358347A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CUI GUOLEI</creatorcontrib><creatorcontrib>YANG HUIJUN</creatorcontrib><creatorcontrib>XUE YIFEI</creatorcontrib><creatorcontrib>ZHAO HAIYUAN</creatorcontrib><creatorcontrib>ZHANG YANJUN</creatorcontrib><creatorcontrib>JIA ZHENHUA</creatorcontrib><creatorcontrib>LI JING</creatorcontrib><creatorcontrib>LYU NING</creatorcontrib><creatorcontrib>WANG CHUNYAN</creatorcontrib><creatorcontrib>YIN JUNSHAN</creatorcontrib><creatorcontrib>NING YONGMING</creatorcontrib><title>Residual life prediction method for intelligent electric meters under different subsystems</title><description>The invention provides a residual life prediction method for intelligent ammeters under different subsystems, and belongs to the technical field of intelligent ammeters. The problem that the existing intelligent electric meter residual life prediction is difficult to popularize or the degradation model is uncertain is solved; comprising the following steps that electromechanical equipment in a building is divided into six subsystems, part of data of known subsystem categories serve as training data to construct a classification model, and the classification model is utilized to obtain operation data of an intelligent electric meter under each subsystem; preprocessing the operation data of the intelligent electric meter, obtaining the main stress influencing the prediction of the residual life of the intelligent electric meter through a correlation analysis method, and selecting the operation data under the main stress to form a data set; performing normalization processing on the data set; dividing a normaliz</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAURuEuDqK-w_UBHEosukpRnBzEyaXE5E-9kCYl93bw7aXgAzid4TvL6nmHsJ9spMgBNBZ4dso50QB9Z08hF-KkiJF7JCVEOC3sZkcRmpJHIc8hoMwu00s-ohhkXS2CjYLNr6tqezk_2usOY-4go3VI0K691XVjmqPZH07mn-cLl1A8Dg</recordid><startdate>20221118</startdate><enddate>20221118</enddate><creator>CUI GUOLEI</creator><creator>YANG HUIJUN</creator><creator>XUE YIFEI</creator><creator>ZHAO HAIYUAN</creator><creator>ZHANG YANJUN</creator><creator>JIA ZHENHUA</creator><creator>LI JING</creator><creator>LYU NING</creator><creator>WANG CHUNYAN</creator><creator>YIN JUNSHAN</creator><creator>NING YONGMING</creator><scope>EVB</scope></search><sort><creationdate>20221118</creationdate><title>Residual life prediction method for intelligent electric meters under different subsystems</title><author>CUI GUOLEI ; YANG HUIJUN ; XUE YIFEI ; ZHAO HAIYUAN ; ZHANG YANJUN ; JIA ZHENHUA ; LI JING ; LYU NING ; WANG CHUNYAN ; YIN JUNSHAN ; NING YONGMING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115358347A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CUI GUOLEI</creatorcontrib><creatorcontrib>YANG HUIJUN</creatorcontrib><creatorcontrib>XUE YIFEI</creatorcontrib><creatorcontrib>ZHAO HAIYUAN</creatorcontrib><creatorcontrib>ZHANG YANJUN</creatorcontrib><creatorcontrib>JIA ZHENHUA</creatorcontrib><creatorcontrib>LI JING</creatorcontrib><creatorcontrib>LYU NING</creatorcontrib><creatorcontrib>WANG CHUNYAN</creatorcontrib><creatorcontrib>YIN JUNSHAN</creatorcontrib><creatorcontrib>NING YONGMING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CUI GUOLEI</au><au>YANG HUIJUN</au><au>XUE YIFEI</au><au>ZHAO HAIYUAN</au><au>ZHANG YANJUN</au><au>JIA ZHENHUA</au><au>LI JING</au><au>LYU NING</au><au>WANG CHUNYAN</au><au>YIN JUNSHAN</au><au>NING YONGMING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Residual life prediction method for intelligent electric meters under different subsystems</title><date>2022-11-18</date><risdate>2022</risdate><abstract>The invention provides a residual life prediction method for intelligent ammeters under different subsystems, and belongs to the technical field of intelligent ammeters. The problem that the existing intelligent electric meter residual life prediction is difficult to popularize or the degradation model is uncertain is solved; comprising the following steps that electromechanical equipment in a building is divided into six subsystems, part of data of known subsystem categories serve as training data to construct a classification model, and the classification model is utilized to obtain operation data of an intelligent electric meter under each subsystem; preprocessing the operation data of the intelligent electric meter, obtaining the main stress influencing the prediction of the residual life of the intelligent electric meter through a correlation analysis method, and selecting the operation data under the main stress to form a data set; performing normalization processing on the data set; dividing a normaliz</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING HANDLING RECORD CARRIERS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING |
| title | Residual life prediction method for intelligent electric meters under different subsystems |
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