Residual life prediction method for intelligent electric meters under different subsystems
The invention provides a residual life prediction method for intelligent ammeters under different subsystems, and belongs to the technical field of intelligent ammeters. The problem that the existing intelligent electric meter residual life prediction is difficult to popularize or the degradation mo...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a residual life prediction method for intelligent ammeters under different subsystems, and belongs to the technical field of intelligent ammeters. The problem that the existing intelligent electric meter residual life prediction is difficult to popularize or the degradation model is uncertain is solved; comprising the following steps that electromechanical equipment in a building is divided into six subsystems, part of data of known subsystem categories serve as training data to construct a classification model, and the classification model is utilized to obtain operation data of an intelligent electric meter under each subsystem; preprocessing the operation data of the intelligent electric meter, obtaining the main stress influencing the prediction of the residual life of the intelligent electric meter through a correlation analysis method, and selecting the operation data under the main stress to form a data set; performing normalization processing on the data set; dividing a normaliz |
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