Method for improving temperature immunity of digital circuit and electronic equipment

The invention discloses a method for improving temperature immunity of a digital circuit and electronic equipment. The method comprises the following steps: selecting a standard unit for transient simulation; tracking a current track and a voltage track of the device, and selecting a voltage sampling point; calculating the effective driving current and the temperature dependence of the device; determining a zero temperature delay working point; establishing a zero-temperature delay working point database of the standard cell library, and determining zero-temperature delay working points from the device level to the standard cell level; a zero temperature coefficient point statistical average value of the standard cell library is used as an initial power supply voltage, and a logic synthesis process is completed; generating a gate-level netlist of the circuit according to a time sequence analysis result of logic synthesis; and carrying out physical design according to the gate-level netlist, converting the gat