High-mode low-resonance response test device and use method

The invention discloses a high-mode low-resonance response test device and a use method. The test device comprises a bottom plate, a support and a positioning and pressing device. The support adopts an integral high-rigidity structure and a local thin-wall structure, namely a thickened base body and...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: JIANG ZHIYUE, XIE LINGJUAN, GUO WENPING
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a high-mode low-resonance response test device and a use method. The test device comprises a bottom plate, a support and a positioning and pressing device. The support adopts an integral high-rigidity structure and a local thin-wall structure, namely a thickened base body and single lug combined structure, the local thin-wall single lug is transited to the thickened base body by adopting a large fillet, the support and a bottom plate of the test device are fixed by adopting a cylindrical pin, and a fixing acting force is applied from a single side of the double-lug structure of a test piece. By using the test device, the double lugs can be fixed from a single side, the operation is simple and quick, bending stress cannot be generated on the double lugs, the actual installation condition is simulated, and meanwhile, the test device can have higher inherent frequency to meet the test requirement. 本发明公开了一种高模态低共振响应试验装置及使用方法,试验装置包括底板、支座和定位压紧装置。支座采用整体高刚性结构+局部薄壁结构,即加厚基体与单耳片组合的结构,局部薄壁的单耳片采用大圆角