Preparation method of silicon nanowire gyroscope based on SOI (Silicon On Insulator) silicon wafer
The invention relates to a preparation method of a silicon nanowire gyroscope based on an SOI (Silicon On Insulator) silicon wafer, which comprises the following steps of: selecting the SOI silicon wafer, and preparing a silicon nitride film on the top silicon surface of the SOI silicon wafer to for...
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention relates to a preparation method of a silicon nanowire gyroscope based on an SOI (Silicon On Insulator) silicon wafer, which comprises the following steps of: selecting the SOI silicon wafer, and preparing a silicon nitride film on the top silicon surface of the SOI silicon wafer to form a dielectric mask layer; forming three triangular patterns on the dielectric mask layer, and etching silicon nitride at the patterns to form three triangular windows; performing dry etching on the silicon at the triangular window to prepare three vertical triangular grooves with the same depth; etching the oxide layer below the vertical triangular groove, and then etching the bottom layer silicon; anisotropic wet etching is carried out on the vertical triangular grooves to form hexagonal etching grooves, a monocrystalline silicon thin-wall structure is formed between every two adjacent hexagonal etching grooves, and two opposite cone structures appear among the three hexagonal etching grooves; a corrosion groove |
---|