Matching point position difference curved surface fitting double-threshold elimination method

The invention discloses a matching point position difference curved surface fitting double-threshold elimination method, and belongs to the technical field of aerial image processing. The invention aims to provide a matching point position difference curved surface fitting double-threshold eliminati...

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Hauptverfasser: SUN WENBANG, YU GUANG, GU ZILYU, YUE GUANG, WU DI, LI TONGSHAO
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a matching point position difference curved surface fitting double-threshold elimination method, and belongs to the technical field of aerial image processing. The invention aims to provide a matching point position difference curved surface fitting double-threshold elimination method for eliminating each matching point by using a fitted curved surface. According to the method, the upper limit threshold curved surface is obtained through the matching point position distance difference obtained by superposing the to-be-registered multispectral image matching points on the reference image, all matching points higher than the upper limit threshold curved surface are mismatching points, the smoothed curved surface is translated downwards, and the lower limit threshold curved surface is obtained; the upper limit threshold curved surface and the lower limit threshold curved surface form a three-dimensional threshold space; mismatching points in a flat terrain area, mismatching points in an u