Optimizing memory access operating parameters

The invention relates to optimizing memory access operating parameters. A respective value of a data state metric associated with each of a plurality of values of a memory access operation parameter used in one or more memory access operations is measured. An optimal metric value based on the measur...

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Hauptverfasser: JEON SEUNG-JUN, XIE TINGJUN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to optimizing memory access operating parameters. A respective value of a data state metric associated with each of a plurality of values of a memory access operation parameter used in one or more memory access operations is measured. An optimal metric value based on the measured value of the predetermined data state metric is determined. An optimal value of the memory access operating parameter from the plurality of values of the memory access operating parameter is selected. 本公开涉及优化存储器存取操作参数。测量与存储器存取操作参数的多个值中的在一或多个存储器存取操作中使用的值中的每一个相关联的数据状态度量的相应值。确定基于预定数据状态度量的测得的值的最佳度量值。选择来自所述存储器存取操作参数的所述多个值的所述存储器存取操作参数的最佳值。