Chip testing device and system

The invention provides a chip testing device and a chip testing system, which are suitable for testing a plurality of chips in a chip group. The chip testing device comprises a signal interface and a test design circuit. The signal interface transmits an input signal from a test device and a plurality of driving signals to each chip in parallel. The test design circuit receives a plurality of output signals from the chip through the signal interface, and serially outputs test data to a test device according to the output signals. 本发明提供一种芯片测试装置及系统，适用于对芯片群组中的多个芯片进行测试。芯片测试装置包括信号接口以及测试设计电路。信号接口将来自测试设备的输入信号及多个驱动信号并列传送至每个芯片。测试设计电路通过信号接口接收来自芯片的多个输出信号，并且根据输出信号串行输出测试数据至测试设备。