Abnormal sample detection method and device, electronic equipment and storage medium

The embodiment of the invention provides an abnormal sample detection method and device, electronic equipment and a storage medium, and belongs to the technical field of artificial intelligence. The abnormal sample detection method comprises the steps that prediction time is determined; obtaining a...

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1. Verfasser: LIN RONGJI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The embodiment of the invention provides an abnormal sample detection method and device, electronic equipment and a storage medium, and belongs to the technical field of artificial intelligence. The abnormal sample detection method comprises the steps that prediction time is determined; obtaining a training sample set and a prediction sample set according to the prediction time; obtaining an initial regression model, and performing model training on the initial regression model according to the training sample set to obtain a target regression model and a first commission prediction value corresponding to the training sample set; inputting the prediction sample set into a target regression model, and predicting the prediction sample set according to the target regression model to obtain a second commission prediction value; determining a target abnormal sample output threshold according to the first commission prediction value and the second commission prediction value; and screening out a target abnormal sam