Flatness measuring method, device, equipment and medium

The invention discloses a flatness measuring method, device and equipment and a medium, and relates to the field of engineering quality management.The method comprises the steps that measuring distances of a plurality of measuring points in a target plane are determined through a preset laser range...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ROH JONG-WON, HAN ZHE, LONG TENGYUN, MO XUJUN, LI QIUYI, HUANG LU
Format: Patent
Sprache:chi ; eng
Schlagworte:
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