Flatness measuring method, device, equipment and medium

The invention discloses a flatness measuring method, device and equipment and a medium, and relates to the field of engineering quality management.The method comprises the steps that measuring distances of a plurality of measuring points in a target plane are determined through a preset laser range...

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Bibliographische Detailangaben
Hauptverfasser: ROH JONG-WON, HAN ZHE, LONG TENGYUN, MO XUJUN, LI QIUYI, HUANG LU
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a flatness measuring method, device and equipment and a medium, and relates to the field of engineering quality management.The method comprises the steps that measuring distances of a plurality of measuring points in a target plane are determined through a preset laser range finder and a preset supporting device, the vertical distance between the measuring point and the preset supporting device is calculated based on the measuring distance; a target range value is calculated based on the vertical distance, and a judgment result for judging whether the target range value is smaller than a preset range threshold value or not is obtained; and determining whether the flatness of the target plane meets a preset flatness requirement or not based on the judgment result. According to the method, follow-up measurement can be performed without using a gradienter and only by presetting the laser range finder and the supporting device, the measurement work is simplified and more convenient, and a