Test adjusting system based on AMOLED Gamma method

The invention relates to the field of Gamma adjustment, and discloses a test adjustment system based on an AMOLED Gamma method.The test adjustment system comprises an upper computer, a probe, a data acquisition module, a data analysis module, a data calculation module, a display module and an adjust...

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Bibliographische Detailangaben
Hauptverfasser:	WEI HE, OUYANG SHENGYUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DISPLAY EDUCATION MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEALS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to the field of Gamma adjustment, and discloses a test adjustment system based on an AMOLED Gamma method.The test adjustment system comprises an upper computer, a probe, a data acquisition module, a data analysis module, a data calculation module, a display module and an adjustment module, the output end of the upper computer is connected with the input end of the probe, the output end of the probe is connected with the input end of the data acquisition module, and the output end of the data analysis module is connected with the input end of the data calculation module. The output end of the data acquisition module is connected with the input end of the data analysis module, the output end of the data analysis module is connected with the input end of the data calculation module, the output end of the data calculation module is connected with the input end of the display module, and the output end of the display module is connected with the input end of the adjustment module. According t