Double-end spring needle test module

The invention discloses a double-end spring needle test module, which comprises an upper module, and is characterized in that the upper module is provided with a plurality of first mounting positions; the lower module is provided with a plurality of second mounting positions, and the second module a...

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Hauptverfasser: JING GAOFEI, DING CHONGLIANG
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creator JING GAOFEI
DING CHONGLIANG
description The invention discloses a double-end spring needle test module, which comprises an upper module, and is characterized in that the upper module is provided with a plurality of first mounting positions; the lower module is provided with a plurality of second mounting positions, and the second module and the first module are assembled together; the double-end spring needles are arranged between the upper module and the lower module, one end of each double-end spring needle extends out of the corresponding first mounting hole, and the other end of each double-end spring needle extends out of the corresponding second mounting hole. The double-end spring needle test module solves the problems that an existing test probe is too complex in structure, high in cost and prone to damaging a circuit board to be tested. 本发明公开了一种双头弹簧针测试模块,包括上模块,所述上模块上设置有多个第一安装位;下模块,所述下模块上设置有多个第二安装位,所述第二模块和第一模块装配在一起;多个双头弹簧针,多个所述双头弹簧针设置在上模块和下模块之间,双头弹簧针的一端从第一安装孔伸出,另一端从第二安装孔伸出。该双头弹簧针测试模块,解决了现有测试探针存在结构过于复杂、成本交高、易损坏待测电路板的问题。
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115184651A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115184651A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115184651A3</originalsourceid><addsrcrecordid>eNrjZFBxyS9NyknVTc1LUSguKMrMS1fIS01NyUlVKEktLlHIzU8pzUnlYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhqaGFiZmpoaOxsSoAQD2wSaQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Double-end spring needle test module</title><source>esp@cenet</source><creator>JING GAOFEI ; DING CHONGLIANG</creator><creatorcontrib>JING GAOFEI ; DING CHONGLIANG</creatorcontrib><description>The invention discloses a double-end spring needle test module, which comprises an upper module, and is characterized in that the upper module is provided with a plurality of first mounting positions; the lower module is provided with a plurality of second mounting positions, and the second module and the first module are assembled together; the double-end spring needles are arranged between the upper module and the lower module, one end of each double-end spring needle extends out of the corresponding first mounting hole, and the other end of each double-end spring needle extends out of the corresponding second mounting hole. The double-end spring needle test module solves the problems that an existing test probe is too complex in structure, high in cost and prone to damaging a circuit board to be tested. 本发明公开了一种双头弹簧针测试模块,包括上模块,所述上模块上设置有多个第一安装位;下模块,所述下模块上设置有多个第二安装位,所述第二模块和第一模块装配在一起;多个双头弹簧针,多个所述双头弹簧针设置在上模块和下模块之间,双头弹簧针的一端从第一安装孔伸出,另一端从第二安装孔伸出。该双头弹簧针测试模块,解决了现有测试探针存在结构过于复杂、成本交高、易损坏待测电路板的问题。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221014&amp;DB=EPODOC&amp;CC=CN&amp;NR=115184651A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221014&amp;DB=EPODOC&amp;CC=CN&amp;NR=115184651A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JING GAOFEI</creatorcontrib><creatorcontrib>DING CHONGLIANG</creatorcontrib><title>Double-end spring needle test module</title><description>The invention discloses a double-end spring needle test module, which comprises an upper module, and is characterized in that the upper module is provided with a plurality of first mounting positions; the lower module is provided with a plurality of second mounting positions, and the second module and the first module are assembled together; the double-end spring needles are arranged between the upper module and the lower module, one end of each double-end spring needle extends out of the corresponding first mounting hole, and the other end of each double-end spring needle extends out of the corresponding second mounting hole. The double-end spring needle test module solves the problems that an existing test probe is too complex in structure, high in cost and prone to damaging a circuit board to be tested. 本发明公开了一种双头弹簧针测试模块,包括上模块,所述上模块上设置有多个第一安装位;下模块,所述下模块上设置有多个第二安装位,所述第二模块和第一模块装配在一起;多个双头弹簧针,多个所述双头弹簧针设置在上模块和下模块之间,双头弹簧针的一端从第一安装孔伸出,另一端从第二安装孔伸出。该双头弹簧针测试模块,解决了现有测试探针存在结构过于复杂、成本交高、易损坏待测电路板的问题。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBxyS9NyknVTc1LUSguKMrMS1fIS01NyUlVKEktLlHIzU8pzUnlYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhqaGFiZmpoaOxsSoAQD2wSaQ</recordid><startdate>20221014</startdate><enddate>20221014</enddate><creator>JING GAOFEI</creator><creator>DING CHONGLIANG</creator><scope>EVB</scope></search><sort><creationdate>20221014</creationdate><title>Double-end spring needle test module</title><author>JING GAOFEI ; DING CHONGLIANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115184651A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JING GAOFEI</creatorcontrib><creatorcontrib>DING CHONGLIANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JING GAOFEI</au><au>DING CHONGLIANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Double-end spring needle test module</title><date>2022-10-14</date><risdate>2022</risdate><abstract>The invention discloses a double-end spring needle test module, which comprises an upper module, and is characterized in that the upper module is provided with a plurality of first mounting positions; the lower module is provided with a plurality of second mounting positions, and the second module and the first module are assembled together; the double-end spring needles are arranged between the upper module and the lower module, one end of each double-end spring needle extends out of the corresponding first mounting hole, and the other end of each double-end spring needle extends out of the corresponding second mounting hole. The double-end spring needle test module solves the problems that an existing test probe is too complex in structure, high in cost and prone to damaging a circuit board to be tested. 本发明公开了一种双头弹簧针测试模块,包括上模块,所述上模块上设置有多个第一安装位;下模块,所述下模块上设置有多个第二安装位,所述第二模块和第一模块装配在一起;多个双头弹簧针,多个所述双头弹簧针设置在上模块和下模块之间,双头弹簧针的一端从第一安装孔伸出,另一端从第二安装孔伸出。该双头弹簧针测试模块,解决了现有测试探针存在结构过于复杂、成本交高、易损坏待测电路板的问题。</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Double-end spring needle test module
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