Double-end spring needle test module
The invention discloses a double-end spring needle test module, which comprises an upper module, and is characterized in that the upper module is provided with a plurality of first mounting positions; the lower module is provided with a plurality of second mounting positions, and the second module a...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a double-end spring needle test module, which comprises an upper module, and is characterized in that the upper module is provided with a plurality of first mounting positions; the lower module is provided with a plurality of second mounting positions, and the second module and the first module are assembled together; the double-end spring needles are arranged between the upper module and the lower module, one end of each double-end spring needle extends out of the corresponding first mounting hole, and the other end of each double-end spring needle extends out of the corresponding second mounting hole. The double-end spring needle test module solves the problems that an existing test probe is too complex in structure, high in cost and prone to damaging a circuit board to be tested.
本发明公开了一种双头弹簧针测试模块,包括上模块,所述上模块上设置有多个第一安装位;下模块,所述下模块上设置有多个第二安装位,所述第二模块和第一模块装配在一起;多个双头弹簧针,多个所述双头弹簧针设置在上模块和下模块之间,双头弹簧针的一端从第一安装孔伸出,另一端从第二安装孔伸出。该双头弹簧针测试模块,解决了现有测试探针存在结构过于复杂、成本交高、易损坏待测电路板的问题。 |
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