Automatic calibration system and method for measuring thickness of plastic film through X rays

The invention discloses an automatic calibration system and method for measuring the thickness of a plastic film through X-rays, and the system comprises an X-ray transmitting end and an X-ray receiving end, an automatic calibration device is arranged between the X-ray transmitting end and the X-ray...

Ausführliche Beschreibung

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Hauptverfasser: CAO JINGZHONG, XU JIA
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses an automatic calibration system and method for measuring the thickness of a plastic film through X-rays, and the system comprises an X-ray transmitting end and an X-ray receiving end, an automatic calibration device is arranged between the X-ray transmitting end and the X-ray receiving end, the automatic calibration device is a rotatable pressure plate structure, and the pressure plate structure is provided with a plurality of standard sheets of the plastic film to be measured. The plurality of standard sheets are uniformly arranged on the same circumference of the pressure plate structure, the automatic calibration device is connected with a control end, the control end is connected with the X-ray receiving end, and the control end controls the pressure plate structure to carry the plurality of standard sheets to do circular motion between the X-ray transmitting end and the X-ray receiving end so as to realize automatic calibration when the thickness of the plastic film is measured by