Random instruction generation test platform for tool chain
The invention discloses a random instruction generation test platform and a random instruction generation test method for an assembler, which are used for testing a target assembler and comprise a random instruction generator, a simple assembler and a comparator, the assembly instruction codes for t...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a random instruction generation test platform and a random instruction generation test method for an assembler, which are used for testing a target assembler and comprise a random instruction generator, a simple assembler and a comparator, the assembly instruction codes for testing are provided for a simple assembler and a target assembler; the simple assembler generates a binary instruction code which can be identified and executed by a machine according to an assembly instruction code for testing provided by the random instruction generator; and the comparator compares the binary instruction codes generated by the simple assembler with binary instruction codes generated by the target assembler according to the assembly instruction codes for testing provided by the random instruction generator one by one, and performs binary instruction code consistency testing of the simple assembler and the target assembler. The method is suitable for testing assemblers of various instruction set ar |
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