Method for evaluating quality of bare chip for satellite

The invention discloses a method for evaluating the quality of a bare chip for a satellite. The method comprises the following steps: sorting basic quality information of bare chip production; collecting process monitoring module parameters of the bare chip; collecting performance parameters of the bare chip; establishing a basic success envelope line of process monitoring module parameters and performance parameters of the bare chip; performing quality evaluation on process monitoring module parameters and performance parameters of the bare chip; and correcting success envelope lines of the process monitoring module parameters and the performance parameters of the bare chip. According to the method, the limitation of a KGD technology and packaging examination is overcome, statistical analysis is carried out on production process technology actual measurement data and bare chip actual measurement performance data, batch data passing test verification or in-orbit flight verification is used as a success basic