Testing device for third-order intermodulation

The invention discloses a testing device for third-order intermodulation, which comprises an intermodulation instrument, a low intermodulation load instrument, a first connector and a second connector, and is characterized in that the first connector is electrically connected with the intermodulatio...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	DU YANWEI, LIANG JIANKE, CHEN YONGYU, WU ZUXING, HUANG RUXIAN, LI YONGCHUN, GUO LINBO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY TRANSMISSION TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
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Beschreibung
Zusammenfassung:	The invention discloses a testing device for third-order intermodulation, which comprises an intermodulation instrument, a low intermodulation load instrument, a first connector and a second connector, and is characterized in that the first connector is electrically connected with the intermodulation instrument and is used for being detachably butted with an input cable of a to-be-tested piece, so that the to-be-tested piece is electrically connected with the intermodulation instrument; the second connector is electrically connected with the low intermodulation load instrument, the number of the second connector is at least one, and the second connector is used for being in detachable butt joint with an output cable of a to-be-tested piece, so that the to-be-tested piece is electrically connected with the low intermodulation load instrument. As the first connector and the second connector are in quick-release butt joint, compared with a traditional welding mode, the test efficiency is high, the test cost is l