X-ray thickness gauge alloy compensation coefficient calibration method and device and storage medium
The invention discloses a calibration method and device for an alloy compensation coefficient of an X-ray thickness gauge and a storage medium. The calibration method comprises the steps that the alloy element content of a to-be-calibrated steel grade is obtained; according to the alloy element cont...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a calibration method and device for an alloy compensation coefficient of an X-ray thickness gauge and a storage medium. The calibration method comprises the steps that the alloy element content of a to-be-calibrated steel grade is obtained; according to the alloy element content, determining a first compensation coefficient and sending the first compensation coefficient to the X-ray thickness gauge; obtaining the actual thickness of the finished steel plate of the to-be-calibrated steel grade; determining a second compensation coefficient according to the thickness deviation between the actual thickness and the set thickness of the finished steel plate; and determining a target alloy compensation coefficient according to the first compensation coefficient and the second compensation coefficient. According to the calibration method, the calibration speed of the alloy compensation coefficient is increased, and risks in the calibration process are reduced.
本发明公开了一种X射线测厚仪合金补偿系数的标定方法、装置及存储介 |
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