Instrument image analysis method and device

The embodiment of the invention discloses an instrument image analysis method and device. The method comprises the following steps: marking an instrument training image to form a plurality of pieces of marking information; inputting the marked instrument training image into an initial model, and sim...

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Bibliographische Detailangaben
Hauptverfasser: LI PENG, DAI QIAN, WANG YIXIN, CHEN HUI, WEI SHANGYANG, ZHU BING, HAN MENG, LU ZIQING, WANG HUAN, TANG ZHIYONG, MA HAOZHENG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The embodiment of the invention discloses an instrument image analysis method and device. The method comprises the following steps: marking an instrument training image to form a plurality of pieces of marking information; inputting the marked instrument training image into an initial model, and simultaneously detecting a plurality of pieces of marking information on the instrument training image through the initial model; the initial model is trained according to the detected multiple pieces of mark information, a detection model is formed, and the multiple pieces of mark information comprise type marks, position marks and n key point marks. According to the invention, the Internet is utilized to identify the types, positions and key points of the instrument, so that the complexity of an algorithm is reduced and the algorithm is easier to implement; and calculating a projection matrix by using the detected key points and the configured key points, and correcting the image by using the projection matrix so as