T/R assembly performance degradation test system

The embodiment of the invention provides a T/R assembly performance degradation test system, which comprises a high and low temperature test box, test equipment, a control panel, a switch network, an upper computer and a power supply assembly, and is characterized in that a T/R assembly is placed in...

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Bibliographische Detailangaben
Hauptverfasser: MENG YAFENG, LIANG GUANHUI, LV GUIZHOU, XU JIAWEN, HAN CHUNHUI, AN TING, ZHU SAI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The embodiment of the invention provides a T/R assembly performance degradation test system, which comprises a high and low temperature test box, test equipment, a control panel, a switch network, an upper computer and a power supply assembly, and is characterized in that a T/R assembly is placed in the high and low temperature test box, the high and low temperature test box is connected with the switch network, the switch network is connected with the test equipment and the control panel, and the upper computer is connected with the control panel. The test equipment and the control panel are both connected with the upper computer, and the power supply assembly is connected with the high and low temperature test box and the upper computer. Automatic testing of a plurality of performance parameters of a plurality of T/R assemblies is realized. 本说明书实施例提供了一种T/R组件性能退化试验系统,包括:高低温试验箱、测试设备、控制板、开关网络、上位机和电源组件,T/R组件放置于所述高低温试验箱内,所述高低温试验箱与所述开关网络连接,所述开关网络连接所述测试设备和控制板,所述测试设备和控制板均与所述上位机连接,所述电源组件与所述高低温试验箱和上位机连接。实现了多个T/R组件多个性