Laser wavelength measuring device and method
The invention provides a laser wavelength measuring device and method, and relates to the technical field of semiconductor lasers, the laser wavelength measuring device comprises a clamp, the clamp comprises a first conductive shunt structure and a second conductive shunt structure, the first conduc...
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| Hauptverfasser: | , , |
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | The invention provides a laser wavelength measuring device and method, and relates to the technical field of semiconductor lasers, the laser wavelength measuring device comprises a clamp, the clamp comprises a first conductive shunt structure and a second conductive shunt structure, the first conductive shunt structure is provided with a first opening, a second opening, a third opening and a fourth opening, and the second conductive shunt structure is provided with a third opening; a first flow channel communicated with the first opening and the second opening, a second flow channel communicated with the third opening and the fourth opening and a third flow channel communicated with the first flow channel and the second flow channel are arranged in the first conductive shunting structure; the second conductive shunt structure is provided with a fifth opening, a sixth opening and a fourth flow channel for communicating the fifth opening with the sixth opening; the first opening and the fourth opening are used |
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