Automated test apparatus for testing semiconductor devices

An automated test apparatus (ATE) for testing a semiconductor device includes a test processor, a spare or contactor plug, and a semiconductor device tester. The reserve includes an electronic component for storing and/or processing data regarding the reserve or a portion of the reserve. The test de...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ALAN WHITE, LUDWIG KEVIN, FELTEN, JUSTIN, POTZINGER, JOHANN, WAGNER MARKUS
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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