Automated test apparatus for testing semiconductor devices

An automated test apparatus (ATE) for testing a semiconductor device includes a test processor, a spare or contactor plug, and a semiconductor device tester. The reserve includes an electronic component for storing and/or processing data regarding the reserve or a portion of the reserve. The test device includes an operator terminal including a display or a GUI, and a data exchange interface connected or connectable to an electronic component within the reserve to display at least data stored in the electronic component. The ATE further comprises a data buffering unit for buffering the data, a maintenance planning and control unit for planning and controlling maintenance actions of the test equipment, and a dedicated database residing in the control computer. 一种用于对半导体器件进行测试的自动化测试设备(ATE)，该测试设备包括测试处理器、备用件或接触器插接件、以及半导体器件测试仪。备用件包括电子部件，该电子部件用于对关于备用件或该备用件的一部分的数据进行存储和/或处理。测试设备包括操作者终端，该操作者终端包括显示器或GUI、以及数据交换接口，该数据交换接口连接至或可连接至备用件内的电子部件，以至少显示存储在电子部件中的数据。ATE还包括用于对数据进行缓冲的数据缓冲单元、用于对测试设备的维护动作进行计划和控制的维护计划和控制单元、以及驻留在控制计算机中的专用