Probe and sample accurate control method and system based on machine vision
The invention discloses a probe and sample accurate control method based on machine vision, and belongs to the field of machine vision measurement, and the method comprises the steps: fixing the positions of a parallel light source and a laser irradiation needle point; obtaining grey-scale maps of t...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a probe and sample accurate control method based on machine vision, and belongs to the field of machine vision measurement, and the method comprises the steps: fixing the positions of a parallel light source and a laser irradiation needle point; obtaining grey-scale maps of the probe and the sample; converting the grey-scale image into a binary image to obtain two separated contours of the probe and the sample; traversing all point sets in the contours, and only keeping the distance between two closest pixel points in the two contours; obtaining a proportional scale of an image size and an actual size based on camera calibration, and converting the distance from the needle point to the sample into an actual distance value and displaying the actual distance value; and the actual distance is fed back to a stepping motor controlled by a three-dimensional displacement table to realize real-time, rapid and accurate control of the probe-sample distance.
本发明公开了一种基于机器视觉的探针与样品精确控制方法,属于机器视觉测量领域, |
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