Optical storage type converter test system and test method thereof

Optical storage type converter test system and test method thereof

The invention relates to an optical storage type converter test system and a test method thereof, the system is provided with an AC simulation power grid power supply, a battery simulator, an IV simulator, an RLC load, a data acquisition device, a computer, a switch cabinet CB1 and a switch cabinet...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHEN MING, HAN CONG, LI ERHAI, LI CHUNYANG, REN GAOQUAN, GUO YINYUAN, WANG ZHENGXIA, YAN LIMING, LI YAPING, CAO YUANWEI, HU WEIDONG, CHEN ZHUO, ZHU YANGYANG, LEE JONG-WON, HE CHUN
Format: Patent
Sprache:chi ; eng
Schlagworte:
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
ELECTRICITY
GENERATION
GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The invention relates to an optical storage type converter test system and a test method thereof, the system is provided with an AC simulation power grid power supply, a battery simulator, an IV simulator, an RLC load, a data acquisition device, a computer, a switch cabinet CB1 and a switch cabinet CB2, the AC simulation power grid power supply, the battery simulator, the IV simulator and the RLC load are connected with a tested device; the tested device, the battery simulator and the IV simulator are connected with the data acquisition device, the alternating current simulation power grid power supply, the battery simulator, the IV simulator and the RLC load are connected with the computer, the switch cabinet CB1 is arranged between the alternating current simulation power grid power supply and the tested device, and the switch cabinet CB1 is connected with the computer. And the switch cabinet CB2 is arranged between the RLC load and the tested device. Resources can be integrated without replacing a test pla