Device for testing use durability of semiconductor device

The invention discloses a use durability testing device of a semiconductor device, and belongs to the field of semiconductor testing equipment. Comprising a test panel, a placement plate mounting groove is formed in the test panel, a test placement plate is movably mounted in the placement plate mounting groove, rotating plate mounting bases are arranged on the four sides of the test panel, rotating fixing plates are movably mounted on the rotating plate mounting bases, and abutting blocks are mounted on the rotating fixing plates; bonding pads corresponding to weld legs of a to-be-tested element are arranged on the four sides of the placement plate mounting groove, the bonding pads are connected with a test circuit, and the test panel is mounted on the vibration test device; a to-be-tested element is placed on the test placing plate, after the test placing plate moves downwards to be horizontal with the test panel, the rotary fixing plate rotates, and the abutting block presses the pin of the to-be-tested el