Chip testing device with limiting function

The invention relates to a testing device, in particular to a chip testing device with a limiting function. The invention provides a chip testing device with a limiting function, which does not need tedious operation of an operator and can quickly and conveniently clamp and loosen a chip. The chip testing device with the limiting function comprises telescopic frames, a testing machine and the like, the number of the telescopic frames is two, the two telescopic frames are arranged in a bilateral symmetry mode, the testing machine is connected between the upper sides of the two telescopic frames, the upper side of the left portion of the testing machine is connected with a first fixing block, and the upper side of the left portion of the testing machine is connected with a second fixing block. First fixing rods are rotationally arranged on the left inner wall and the right inner wall of the first fixing block. An operator moves the second sliding frame leftwards to enable the two clamping blocks to clamp a chip