Method for automatically testing all parameters of axial angle-digital conversion series chip
The invention relates to a full-parameter automatic testing method for an axial angle-digital conversion series chip, which comprises the following steps of: setting and controlling equipment instruments of an automatic testing system by utilizing automatic testing software; controlling static angle...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a full-parameter automatic testing method for an axial angle-digital conversion series chip, which comprises the following steps of: setting and controlling equipment instruments of an automatic testing system by utilizing automatic testing software; controlling static angle precision, digital output high-low level voltage, speed signal reverse error, speed signal linearity, speed signal zero voltage, forbidding/refreshing voltage, enabling/three-state voltage, busy signal positive pulse width, zero-crossing signal, built-in test signal and resolution of the axial angle-digital conversion series chip according to the set automatic test process; parameter selection control is carried out, performance parameters and functions of reference voltage, false zero position, working current and speed voltage value are automatically tested, and test data and results are automatically recorded and stored. According to the invention, automatic testing of the axial angle conversion chip of the axi |
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