Amplifier test circuit and test method

The invention discloses an amplifier test circuit and a test method, and relates to the field of integrated circuit testing, the amplifier test circuit comprises a signal source, a multi-path filter bank A, a tested amplifier, a multi-path filter bank B, a measuring device and a data processing modu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	XU WENZHE, GENG LI, CAI JIAXUAN, ZHANG LIANGHAO, XU JIANGTAO, WU MINSHUN, ZHANG XIAOPENG, BAN CHENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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