Amplifier test circuit and test method
The invention discloses an amplifier test circuit and a test method, and relates to the field of integrated circuit testing, the amplifier test circuit comprises a signal source, a multi-path filter bank A, a tested amplifier, a multi-path filter bank B, a measuring device and a data processing modu...
Gespeichert in:
Hauptverfasser: | , , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention discloses an amplifier test circuit and a test method, and relates to the field of integrated circuit testing, the amplifier test circuit comprises a signal source, a multi-path filter bank A, a tested amplifier, a multi-path filter bank B, a measuring device and a data processing module, the output end of the multi-path filter bank A is connected with the input end of the tested amplifier, the output end of the tested amplifier is connected with the input end of the multi-path filter bank B, the output end of the multi-path filter bank B is connected with the input end of the measuring device, and the output end of the measuring device is connected with the input end of the data processing module; each of the multi-path filter bank A and the multi-path filter bank B at least comprises two filtering paths, and the filtering paths can be switched for use; the method can reduce the precision requirement of the amplifier test on a signal source and/or a measuring device, reduces the dependence of t |
---|