Amplifier test circuit and test method

The invention discloses an amplifier test circuit and a test method, and relates to the field of integrated circuit testing, the amplifier test circuit comprises a signal source, a multi-path filter bank A, a tested amplifier, a multi-path filter bank B, a measuring device and a data processing modu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: XU WENZHE, GENG LI, CAI JIAXUAN, ZHANG LIANGHAO, XU JIANGTAO, WU MINSHUN, ZHANG XIAOPENG, BAN CHENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses an amplifier test circuit and a test method, and relates to the field of integrated circuit testing, the amplifier test circuit comprises a signal source, a multi-path filter bank A, a tested amplifier, a multi-path filter bank B, a measuring device and a data processing module, the output end of the multi-path filter bank A is connected with the input end of the tested amplifier, the output end of the tested amplifier is connected with the input end of the multi-path filter bank B, the output end of the multi-path filter bank B is connected with the input end of the measuring device, and the output end of the measuring device is connected with the input end of the data processing module; each of the multi-path filter bank A and the multi-path filter bank B at least comprises two filtering paths, and the filtering paths can be switched for use; the method can reduce the precision requirement of the amplifier test on a signal source and/or a measuring device, reduces the dependence of t