Amplifier test circuit and test method
The invention discloses an amplifier test circuit and a test method, and relates to the field of integrated circuit testing, the amplifier test circuit comprises a signal source, a multi-path filter bank A, a tested amplifier, a multi-path filter bank B, a measuring device and a data processing modu...
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| creator | XU WENZHE GENG LI CAI JIAXUAN ZHANG LIANGHAO XU JIANGTAO WU MINSHUN ZHANG XIAOPENG BAN CHENG |
| description | The invention discloses an amplifier test circuit and a test method, and relates to the field of integrated circuit testing, the amplifier test circuit comprises a signal source, a multi-path filter bank A, a tested amplifier, a multi-path filter bank B, a measuring device and a data processing module, the output end of the multi-path filter bank A is connected with the input end of the tested amplifier, the output end of the tested amplifier is connected with the input end of the multi-path filter bank B, the output end of the multi-path filter bank B is connected with the input end of the measuring device, and the output end of the measuring device is connected with the input end of the data processing module; each of the multi-path filter bank A and the multi-path filter bank B at least comprises two filtering paths, and the filtering paths can be switched for use; the method can reduce the precision requirement of the amplifier test on a signal source and/or a measuring device, reduces the dependence of t |
| format | Patent |
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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Amplifier test circuit and test method |
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