Testing method of high-precision large-through-flow micro-impedance resistor and non-inductive resistor module
The invention relates to the technical field of non-inductive resistor performance testing, solves the technical problem that related performance of a load cannot be simulated and tested before a real test at present, and particularly relates to a high-precision large-through-flow micro-impedance re...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of non-inductive resistor performance testing, solves the technical problem that related performance of a load cannot be simulated and tested before a real test at present, and particularly relates to a high-precision large-through-flow micro-impedance resistor testing method which comprises the following steps: S1, selecting a basic load resistor in a to-be-tested resistor module; s2, actually measuring a resistance value and an inductance value of the basic load resistor; s3, carrying out a through-current test on the basic load resistor; s4, building a test platform according to the simulation model, and connecting the basic load resistor to the test platform for a through-flow actual test; s5, carrying out a temperature change test on the basic load resistor; if the overall temperature rise of the basic load resistor is controllable, the overall structure of the basic load resistor is stable and reliable. According to the invention, the purpose of carrying out |
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