Tracking precision measuring device based on two-dimensional fast control reflector
The invention discloses a tracking precision measuring device based on a two-dimensional fast control reflecting mirror. The tracking precision measuring device comprises a light source, a multispectral target, an optical collimation system, the two-dimensional fast reflecting mirror, an offner opti...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a tracking precision measuring device based on a two-dimensional fast control reflecting mirror. The tracking precision measuring device comprises a light source, a multispectral target, an optical collimation system, the two-dimensional fast reflecting mirror, an offner optical system, a short-wave infrared camera, an image collecting and processing system, a computer and a photoelectric tracker. According to the invention, a two-dimensional fast reflector with high angle control precision is adopted to reflect an illumination target to simulate a dynamic target, accurate high-speed scanning motion is implemented, and meanwhile, the simulation range of the dynamic target is widened, so that high-precision photoelectric system tracking precision measurement is realized.
本发明公开了一种基于二维快速控制反射镜的跟踪精度测量装置,其包括:光源、多光谱目标靶、光学准直系统、二维快速反射镜、offner光学系统、短波红外相机、图像采集处理系统、计算机以及光电跟踪仪。本发明采用角控制精度高的二维快速反射镜反射照明目标模拟动态目标,实施精确高速扫描运动,同时提高动态目标模拟的范围,从而实现高精度的光电系统跟踪精度测量。 |
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