Defect identification method and device
The invention relates to a defect identification method and device, computer equipment, a storage medium and a computer program product. The method comprises: a computing device receives a magnetic flux leakage signal of a to-be-tested piece sent by a magnetic flux leakage sensor, the magnetic flux...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a defect identification method and device, computer equipment, a storage medium and a computer program product. The method comprises: a computing device receives a magnetic flux leakage signal of a to-be-tested piece sent by a magnetic flux leakage sensor, the magnetic flux leakage signal being a signal corresponding to a leakage magnetic field generated by a defect of the to-be-tested piece, and the computing device receives a magnetic disturbance signal of the to-be-tested piece sent by a magnetic disturbance sensor, the magnetic disturbance signal being a signal corresponding to a leakage magnetic field generated by a defect of the to-be-tested piece; the magnetic disturbance signal is a signal corresponding to a disturbance magnetic field generated by the defect of the to-be-tested piece, then the computing device determines whether the to-be-tested piece has the defect according to the magnetic leakage signal, if the to-be-tested piece has the defect, the computing device determi |
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